Digital sampling oscilloscope. The ultimate in signal fidelity for challenging high-speed characterization tests. With an industry-leading intrinsic jitter of less than 100femtoseconds for extremely accurate device characterization, the DSA8300 series provides comprehensive support for optical communications standards, Time Domain Reflectometry and S-parameters. The DSA8300 digital sampling oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G. Well-suited for electrical signal path characterization, whether for packages, PCBs or electrical cables. With exceptional bandwidth, signal fidelity and the most extensible modular architecture, the DSA8300 provides the highest-performance TDR and interconnect analysis, most accurate analysis of signal impairments and BER calculations for current and emerging serial data technology. Specialized modules supporting features such as single-ended and differential electrical clock recovery, electrostatic protection for electrical samplers and connectivity to the popular TekConnect probing system brings you the performance of state-of-the-art Tektronix probes for high-impedance and differential probing. Low-impedance probes for 50ohm probing and for TDR probing are also available.
- Highest fidelity signal capture
- Very low time-base jitter
- Industry’s highest vertical resolution of 16 bit A/D
- Flexible configurations
- Superior performance with extraordinary versatility
- With jitter, noise, BER and serial data link analysis
- High-speed optical test solutions
- Clock recovery for optical testing
- Measurement and analysis tools for optical testing applications
- High-performance electrical test solutions
